Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2004.06b
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- Pages.327-330
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- 2004
Characterization of Hot Carrier Mechanism of Nano-Scale CMOSFETs
나노급 소자의 핫캐리어 특성 분석
- Na Jun-Hee (Electrical and Computer Engineering Chungnam National University) ;
- Choi Seo-Yun (Electrical and Computer Engineering Chungnam National University) ;
- Kim Yong-Goo (Electrical and Computer Engineering Chungnam National University) ;
- Lee Hi-Deok (Electrical and Computer Engineering Chungnam National University)
- Published : 2004.06.01
Abstract
It is shown that the hot carrier degradation due to enhanced hot holes trapping dominates PMOSFETs lifetime both in thin and thick devices. Moreover, it is found that in 0.13
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