Determination of In/Si(111)-4${\times}$1 phase coverage and bias dependent STM images

  • Yu, Sang-Yong (Korea Research Institute of Standards and Science) ;
  • Kim, Han-Chul (Korea Research Institute of Standards and Science) ;
  • Koo, Ja-Yong (Korea Research Institute of Standards and Science) ;
  • Lee, Hyung-Ik (Korea Research Institute of Standards and Science) ;
  • Moon, Dae-Won (Korea Research Institute of Standards and Science) ;
  • Lee, Geun-Seop (Korea Research Institute of Standards and Science)
  • Published : 2003.02.14