한국진공학회:학술대회논문집 (Proceedings of the Korean Vacuum Society Conference)
- 한국진공학회 2003년도 제25회 학술발표회 초록집
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- Pages.186-186
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- 2003
Current Measurement of Organic Resists Using an Atomic Force Microscope Lithography and Scanning Tunneling Spectroscopy
- Kim, Jeong-Oh (Department of Chemistry, Hanyang University) ;
- Shin, Wan-Sub (Department of Chemistry, Hanyang University) ;
- Lee, Hai-Won (Department of Chemistry, Hanyang University)
- 발행 : 2003.08.20