Fault Current Limiting Characteristics Dependent on Winding Direction between $1^{st}$ and $2^{nd}$ Winding of Flux-Lock Type SFCL

  • Lim, Sung-Hun (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
  • Choi, Hyo-Sang (Electrical Engineering Dept. Chosun Uni.) ;
  • Lee, Jong-Hwa (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
  • Ko, Seok-Cheol (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
  • Kang, Hyeong-Gon (Semiconductor Physics Research Center) ;
  • Han, Byoung-Sung (School of Electronics&Information Engineering, Chonbuk National Uni.)
  • 발행 : 2003.08.18