Critical Current Degradation Characteristics by Temperature Difference of $LN_2$-Normal in Bending Strain of High Temperature Superconducting Tapes

  • Kim, H.Joon. (Korea Electrotechnology Research Institute(KERI)) ;
  • Sim, K.D. (Korea Electrotechnology Research Institute(KERI)) ;
  • Cho, J.W. (Korea Electrotechnology Research Institute(KERI)) ;
  • Joo, J.H. (Korea Electrotechnology Research Institute(KERI)) ;
  • Kim, H.J. (Korea Electrotechnology Research Institute(KERI)) ;
  • Bae, J.H. (Korea Electrotechnology Research Institute(KERI))
  • Published : 2003.08.18