Submicron Stacked-junction Fabrication from Bi$_{2}Sr_{2}CaCu_{2}O_{8+{\delta}}$ Whiskers by Focused-ion-beam (FIB) Etching
- Kim, S.J. (Cheju National University) ;
- Latyshev, Yu.I. (Institute of Radio-Engineering and Electronics, Russian Acad. of Sciences) ;
- Hatano, T. (National Institute of Materials Science) ;
- Kim, G.S. (Cheju National University) ;
- Yamashita, T. (National Institute of Materials Science)
- Published : 2003.08.18