대한기계학회:학술대회논문집 (Proceedings of the KSME Conference)
- 대한기계학회 2003년도 추계학술대회
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- Pages.1560-1565
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- 2003
AFM 마이크로캔틸레버의 나노 비선형 동역학
Nanoscale Nonlinear Dynamics on AFM Microcantilevers
- Lee, S.I. ;
- Hong, S.H. ;
- Lee, J.M. ;
- Raman, A. (School of Mechanical Eng., Purdue University) ;
- Howell, S.W. (Department of Physics, Purdue University) ;
- Reifenberger, R. (Department of Physics, Purdue University)
- 발행 : 2003.11.05
초록
Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on nonlinear dynamical systems theory, computational continuation techniques and detailed experiments that yield new perspectives and insight into AFM. A dynamic model including van der Waals and Derjaguin-Muller-Toporov (DMT) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency. Turning points on the surface lead to hysteretic amplitude jumps as the tip nears/retracts from the sample. Experiments are performed using a tapping mode tip on a graphite sample to verify the predictions.