한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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- Pages.1155-1156
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- 2003
Advanced Analysis Techniques for Oxide Cathodes
- Je, Jung-Ho (Department of Materials Science & Engineering, POSTECH) ;
- Kim, In-Woo (Department of Materials Science & Engineering, POSTECH) ;
- Seol, Seung-Kwon (Department of Materials Science & Engineering, POSTECH) ;
- Kwon, Yong-Bum (Department of Materials Science & Engineering, POSTECH) ;
- Cho, Chang-Sik (Department of Materials Science & Engineering, POSTECH) ;
- Weon, Byung-Mook (LG.Philips Displays 184) ;
- Park, Gong-Seog (LG.Philips Displays 184) ;
- Hwang, Cheol-Ho (LG.Philips Displays 184) ;
- Hwu, Yeukuang (Institute of Physics, Academia Sinica) ;
- Tsai, Wen-Li (Institute of Physics, Academia Sinica)
- 발행 : 2003.07.09
초록
The advanced analysis techniques such as high resolution X-ray absorption spectroscopy (XAS), X-ray scattering, and photoelectron emission microscope (PEEM) using synchrotron radiation are probably able to open new opportunities for improving the performances of oxide cathodes with more clear and deep understanding.
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