Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.11a
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- Pages.494-497
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- 2003
Investigation of dark spots in organic light emitting diodes by using a near-field scanning microwave microscope
마이크로파 근접장 현미경을 이용한 유기 발광소자내 dark spot 연구
- Yun, Soon-Il (Seokang Univ.) ;
- Yoo, Hyun-Jun (Seokang Univ.) ;
- Park, Mi-Hwa (Seokang Univ.) ;
- Kim, Song-Hui (Seokang Univ.) ;
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Lee, Kie-Jin
(Seokang Univ.)
- Published : 2003.11.13
Abstract
We report the dark spots in organic light emitting diodes by using a near-field scanning microwave microscope. Devices structure was glass / indium-tin-oxide(ITO) / copper-pthalocyiane(Cu-Pc) / tris-(8-hydroquinoline)aluminum(Alq3) / aluminum(Al). We made artificial dark spots by using a etching technique on a ITO substrate. Near-field scanning microwave microscope images and reflective coefficient of dark spots were measured and compared by the change of various applied voltage changes 0-15V.
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