Microwave Dielectric Properties and Microstructure of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$Ceramics with Sintering Temperature

소결온도에 따른 $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ 세라믹스의 마이크로파 유전특성과 미세구조

  • Published : 2003.10.31

Abstract

The microwave dielectric properties and microstructure of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ ceramics were investigated. All sample of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ ceramics were prepared by conventional mixed oxide method. The sintering temperature was $1375^{\circ}C{\sim}1450^{\circ}C$. The structural properties of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ ceramics were investigated by X-ray diffractormeter. According to the X-ray diffraction patterns of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ ceramics, the major phase of the hexagonal $Mg_4Ta_2O_9$ were presented. In the case of the $0.7Mg_4Ta_2O_9-0.3CaTiO_3$ ceramics sintered at $1425^{\circ}C$, density, dielectric constant, quality factor were $5.799g/cm^2$, 23.26, 40,054 GHz, respectively.

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