대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2003년도 학술대회 논문집 전문대학교육위원
- /
- Pages.113-116
- /
- 2003
BiCMOS 회로의 고장 검출을 위한 테스트 패턴 생성
Test Pattern Generation for Detection of faults in BiCMOS Circuits
- Shin, Jae-Heung (Dong Seoul College) ;
- Lee, Byung-Hyo (Dong Seoul College) ;
-
Kim, Il-Nam
(Dong Seoul College)
;
- Lee, Bok-Yong (Dong Seoul College)
- 발행 : 2003.07.06
초록
BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In this paper, proposes a method for efficiently generating test pattern which detect faults in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.
키워드