Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Study of ME St CF Evaluation for EJB Bean Class Based Design Pattern

디자인패턴 기반 EJB Bean 클래스의 MIF와 CF의 측정에 관한 연구

  • 이돈양 (경희대학교 컴퓨터공학과) ;
  • 신재준 (경희대학교 컴퓨터공학과) ;
  • 송영재 (경희대학교 컴퓨터공학과)
  • Published : 2003.07.01
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Abstract

We will take a multitude EJB Design Patterns that you can harness to enhance your EJB Project today In this paper, we propose the EJB Based Entity Bean DBMS connecting system. Generally, EJB Based Entity Beans are respectively connected by DBMS. Therefore, for the this problems we suggest that Abstract Factory pattern uses DBMS connecting of Entity Beans. As a result, we evaluate MIF and CF in every class relationship.

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