대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2003년도 하계종합학술대회 논문집 Ⅲ
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- Pages.1613-1616
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- 2003
디자인패턴 기반 EJB Bean 클래스의 MIF와 CF의 측정에 관한 연구
A Study of ME St CF Evaluation for EJB Bean Class Based Design Pattern
초록
We will take a multitude EJB Design Patterns that you can harness to enhance your EJB Project today In this paper, we propose the EJB Based Entity Bean DBMS connecting system. Generally, EJB Based Entity Beans are respectively connected by DBMS. Therefore, for the this problems we suggest that Abstract Factory pattern uses DBMS connecting of Entity Beans. As a result, we evaluate MIF and CF in every class relationship.
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