대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2003년도 컴퓨터소사이어티 추계학술대회논문집
- /
- Pages.27-30
- /
- 2003
Pipeline 시스템의 Hazard 검출기를 위한 BIST 설계
BIST Design for Hazard controller in Pipeline System
초록
The recent technology developments introduce new difficulties into the test process by the increased complexity of the chip. Most widely used method for testing high complexity and embedded systems is built-in self-test(BIST). In this paper, we describe 5-stage pipeline system as circuit under testing(CUT) and proposed a BIST scheme for the hazard detection unit of the pipeline system. The proposed BIST scheme can generate sequential instruction sets by pseudo-random pattern generator that can detect all hazard issues and compare the expected hazard signals with those of the pipelined system. Although BIST schemes require additional area in the system, it proves to provide a low-cost test solution and significantly reduce the test time.
키워드