대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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적응적 임계화법에 기반한 LCD 얼룩 검사

Adaptive Multi-threshold Based Mura Detection on A LCD Panel

  • 류재승 (경북 대학교 대학원 전자공학과) ;
  • 곽동민 (경북 대학교 대학원 전자공학과) ;
  • 박길흠 (경북 대학교 대학원 전자공학과)
  • 발행 : 2003.11.01
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초록

In this paper, a new automated defects detection method for a TFT-LCD panel is presented. An input image is preprocessed to lessen small abnormal noises and non-uniformity of the image. The adaptive multi-thresholds are used to detect Muras, which are the major defects occurred on TFT-LCD panels. Those are determined adaptively depending on the brightness and the brightness distribution of a local block. For the synthetic images and real Mura images, the proposed algorithm can effectively detect Muras in a reasonable time.

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