Evaluation of Nano-size Defect in Chromium Layers by Small Angle Neutron Diffractometry

  • Park, Y. (Sunmoon University) ;
  • Kim, Man (Korea Institute of Machinery and Materials) ;
  • S. C Kwon (Korea Institute of Machinery and Materials) ;
  • Y. S. Hahn (HANARO, KAERI)
  • Published : 2003.10.01