Effect of transverse compressive stress on $I_{c}$ degradation characteristics in Bi-2223 superconducting tapes

Bi-2223 초전도테이프의 임계전류 열화특성에 미치는 횡방향 압축응력의 영향

  • 신형섭 (안동대학교) ;
  • 김병수 (안동대학교 대학원) ;
  • 오상수 (한국전기연구원 초전도응용연구팀) ;
  • 하동우 (한국전기연구원 초전도응용연구팀) ;
  • 하홍수 (한국전기연구원 초전도응용연구팀)
  • Published : 2003.02.01

Abstract

Influences of transverse compressive stress on the critical current ( $I_{c}$) in AgMg and AgMn alloy sheathed Bi-2223 tapes were investigated at 77 K and 0 T. The $I_{c}$ degradation behavior depending on sample specifications was discussed in viewpoints of n-value and damage morphology. As a result, Bi-2223 tapes showed a significant drop in $I_{c}$ for stresses greater than 50MPa. The AgMg sheathed Bi-2223 tapes representing higher $I_{c}$ showed a lower $\sigma$$_{irr}$ and a significant $I_{c}$ degradation with increase in compressive stress. There existed a voltage tap separation dependency of the $I_{c}$ degradation behavior caused by the transverse compressive stress.sive stress.s.

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