Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 1998.06a
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- Pages.769-772
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- 1998
On-line visin system for transistor inspection
트랜지스터 검사용 온라인 비젼 시스템
Abstract
This paper present an efficient techniques for visual inspection of taped electronic parts, suitable for real time implementation. The main environments of developed system are IBM-compatible personal computer, frame grabber, digital input-output board. It is connected to the programmable logic controller unit of the taping machine in real time. Using a queuing structure, operator or extractor machine can remove easily the defect one from production line. Also, we design a new illumination system for sacquring shape and subface features of object. Therefore, it redue pre-processing step and processing time.
Keywords