Hopping Al atom on the $Si(111)7{\times}7$ surface studied by scanning tunneling microscope

• Uchida H. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Kuroda T. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Mohamad Fariza B. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Kim J. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Kashiwagi K. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Nishimura K. (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
• Inoue M. (Department of Electric and Electronic Engineering, Toyohashi University of Technology)

• Published : 2003.12.01

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