Exchange Bias Effected by Ion Beam Etching of FeMn Surface in Ta/NiFe/FeMn

  • Yoon S. M. (Department of Materials Science & Engineering, Chungnam National University) ;
  • Lim J. J. (Department of Materials Science & Engineering, Chungnam National University) ;
  • Lee Y. W. (Department of Materials Science & Engineering, Chungnam National University) ;
  • Kim C. G. (Department of Materials Science & Engineering, Chungnam National University) ;
  • Kim C. O. (Department of Materials Science & Engineering, Chungnam National University)
  • 발행 : 2003.12.01