Amorphous wire & CMOS IC based sensitive micro magnetic sensors using magneto-impedance (MI) and stress-impedance (SI) effects for intelligent systems

  • Mohri K. (Department of Electrical Eng., Nagoya University) ;
  • Cai C. M. (Department of Electrical Eng., Nagoya University) ;
  • Shen L. P. (Hitachi Ltd., Central Research Inst.) ;
  • Honkura Y. (Aichi Steel Co.) ;
  • Panina L. V. (Moscow Physical and Engineering Univ.)
  • Published : 2003.12.01