Analytical Examination of KERI Synthetic Short-circuit Current Making Test Circuit

KERI 합성투입시험회로의 해석적 고찰

In the present IEC 60427(2000), reduced applied voltage can be used for synthetic short-circuit making current tests if the maximum pre-arcing time of the test circuit breaker is less than $1/{\omega}$. But in the near future IEC, only the making tests with full test voltage shall be allowed. To meet this trend, KERI is preparing synthetic making test facilities using step-up transformer, ITMC and plasma making switch. This paper presents analytical characteristics of KERI's synthetic short-circuit making test circuits. The results of this paper can be useful for effective and adequate tests.