대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2003년도 하계학술대회 논문집 C
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- Pages.1840-1842
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- 2003
분광법을 이용한 아크 플라즈마의 온도 및 성분 측정
Measurement of a temperature and components of arc plasma with a spectroscopic method
- Jeong, Young-Woo (LG Industrial Systems, Electrotechnology R&D Center) ;
- Lee, Sang-Youb (LG Industrial Systems, Electrotechnology R&D Center) ;
- Park, Hong-Tae (LG Industrial Systems, Electrotechnology R&D Center) ;
- Oh, Il-Sung (LG Industrial Systems, Electrotechnology R&D Center)
- 발행 : 2003.07.21
초록
This paper describes an experiment of detecting a temperature and components of arc plasma of electrical circuit breaker with a spectroscopic system. The system includes an optical fiber, a monochromator which has three gratings from low to high resolution and ICCD of which time resolution is 50 ns. This system enables measuring a temperature and components of arc plasma of a circuit breaker which is generated and extinguished in a few ms. We use a Planck's law and Boltzmann Plot method for calculating a temperature of arc plasma. A Xenon lamp is used for calibrating the system and this is very important for calculating a temperature of arc plasma. In this study, Arc plasma of Ag and Cu contact was investigated and these represent the contact of low voltage and extra-ultra high voltage circuit breaker, respectively. 8
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