대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2003년도 하계학술대회 논문집 D
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- Pages.2453-2455
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- 2003
클러스터링 알고리즘을 이용한 SMT 검사기의 검사시간 단축 방법
The Reduction Methods of Inspection Time for SMT Inspection Machines Using Clustering Algorithms
- Kim, Hwa-Jung (Dept. of Control & Instrumentation Eng., Chungbuk National University) ;
- Park, Tae-Hyoung (School of Electrical & Computer Eng., Chungbuk National University)
- 발행 : 2003.07.21
초록
We propose a path planning method to reduce the inspection time of AOI (automatic optical inspection) machines in SMT (surface mount technology) in-line system. Inspection windows of board should be clustered to consider the FOV (field-of-view) of camera. The number of clusters is desirable to be minimized in order to reduce the overall inspection time. We newly propose a genetic algorithm to minimize the number of clusters for a given board. Comparative simulation results are presented to verify the usefulness of proposed algorithm.
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