대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

클러스터링 알고리즘을 이용한 SMT 검사기의 검사시간 단축 방법

The Reduction Methods of Inspection Time for SMT Inspection Machines Using Clustering Algorithms

  • 김화중 (충북대학교 대학원 제어계측공학과) ;
  • 박태형 (충북대학교 전기전자컴퓨터공학부)
  • Kim, Hwa-Jung (Dept. of Control & Instrumentation Eng., Chungbuk National University) ;
  • Park, Tae-Hyoung (School of Electrical & Computer Eng., Chungbuk National University)
  • 발행 : 2003.07.21
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초록

We propose a path planning method to reduce the inspection time of AOI (automatic optical inspection) machines in SMT (surface mount technology) in-line system. Inspection windows of board should be clustered to consider the FOV (field-of-view) of camera. The number of clusters is desirable to be minimized in order to reduce the overall inspection time. We newly propose a genetic algorithm to minimize the number of clusters for a given board. Comparative simulation results are presented to verify the usefulness of proposed algorithm.

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