Investigation of high speed deformed Ni/Cu layers using Auger electron spectroscopy

  • Lee, Jong-Wan (Dept. of Physics, Hallym University) ;
  • Nakamura, M. (Fujitsu Analysis Laboratory LTD) ;
  • Une, T. (Hiroshima Institute of Technology) ;
  • Tanaka, T. (Hiroshima Institute of Technology) ;
  • Komatsu, M. (Hiroshima Institute of Technology) ;
  • Kiritani, M. (Hiroshima Institute of Technology)
  • Published : 2002.02.19