Real-time, in situ monitoring of 5-fold InAs/InP quantum dot stacks by spectral reflectance

  • Park, Kwang-Min (School of Materials Science and Engineering, Seoul National University) ;
  • Hwang, Hee-Don (School of Materials Science and Engineering, Seoul National University) ;
  • Kang, Jong-Hoon (School of Materials Science and Engineering, Seoul National University) ;
  • Yoon, Suk-Ho (School of Materials Science and Engineering, Seoul National University) ;
  • Kim, Yong-Dong (Department of Physics, Kyunghee University) ;
  • Yoon, Eui-Joon (School of Materials Science and Engineering, Seoul National University)
  • Published : 2002.06.27