Optimized PIT Process to Improve Sausaging and Engineering Critical Current Density in Bi-2223/Ag Tapes
- Ha, H.S. (Korea Electrotechnology Research Institute) ;
- Kim, S.C. (Nexans Korea Ltd.,) ;
- Lee, D.H. (Korea Electrotechnology Research Institute) ;
- Kim, H.D. (Korea Electrotechnology Research Institute) ;
- Yang, J.S. (Korea Electrotechnology Research Institute) ;
- Choi, J.K. (Korea Electrotechnology Research Institute) ;
- Yun, J.K. (Korea Electrotechnology Research Institute) ;
-
Ha, D.W.
(Korea Electrotechnology Research Institute)
;
- Oh, S.S. (Korea Electrotechnology Research Institute) ;
-
Kwon, Y.K.
(Korea Electrotechnology Research Institute)
- Published : 2002.08.20