Performance Test of High-speed Probe for Single Flux Quantum Circuits
- Kim, Sang-Mun (Korea Institute of Science and Technology, Yonsei University) ;
- Choi, Jong-Hyun (Korea Institute of Science and Technology) ;
- Kim, Young-Hwan (Korea Institute of Science and Technology) ;
-
Kang, Joon-Hee
(University of Incheon)
;
- Yoon, Ki-Huyn (Yonsei University)
- Published : 2002.08.20