Modeling of EMI Source Using Inverse Techniques

역산 기법을 이용한 EMI Source의 모델링

  • 임창환 (서울대학교 전기공학부) ;
  • 정현교 (서울대학교 전기공학부) ;
  • 김형석 (순천향대학교 정보기술공학부) ;
  • 이정해 (홍익대학교 전파통신공학과)
  • Published : 2002.08.01

Abstract

In this paper a technique to estimate EMI source distribution on a digital circuit board is introduced. A sensitivity analysis method is applied to reconstruct the source distribution from measured electric field data. Results from a single-layer measurement and a double-layer measurement are compared. It will be shown, from the simulation, that the use of sensitivity analysis for the EMI source reconstruction problem can be a very promising technique.

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