한국정밀공학회:학술대회논문집 (Proceedings of the Korean Society of Precision Engineering Conference)
- 한국정밀공학회 2002년도 추계학술대회 논문집
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- Pages.164-167
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- 2002
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- 2005-8446(pISSN)
반도체 웨이퍼용 스크라이빙 머신의 파라메터 결정
The Parameter Determination of Scribing Machine for Semiconductor Wafer
초록
The general dicing process cuts a semiconductor wafer to lengthwise and crosswise direction by using a rotating circular diamond blade. But inferior goods are made under the influence of several parameters in dicing process such as blade, wafer, cutting water and cutting conditions. Moreover we can not applicable this dicing method to GaN wafer, because the GaN wafer is harder than the other wafer such as SiO