대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2002년도 하계종합학술대회 논문집(5)
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- Pages.211-214
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- 2002
연속 생산 라인에서의 고속 라인 스캔 검사 시스템 구축
A Implementation of a Line Scan System for Continuous Manufacturing Process
- Lim, Cheung (Dept. of Electronics, Ajou University) ;
- Lee, Jong-Min (Dept. of Electronics, Ajou University) ;
- Kim, Yong-Deak (Dept. of Electronics, Ajou University)
- 발행 : 2002.06.01
초록
Under a continuous manufacturing process, two dimension inspection system causes problems as blurring effect and low resolution and requires position calibration between frames. One dimension inspection system is, therefore, being researched as a substitution. In this paper, we implement mechanism of switching memory and processing data for reasonable one dimension inspection system. Redundant weft image and noise was suggested to be reduced by new method using modified morphological process and masked erosion process. From resulting image, line data and possible error information were obtained and constructed as a structure. Finally, error detecting algorithm was performed with this data structure. Processing time of error detecting was 0.625ms per line in applied system and experiment showed 94.7% of error detecting ability. This method is 20% faster in speed and 2.7% higher in error detecting ability comparing with the present method.
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