Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Charge Injection 보상 회로의 비교

  • 박상훈 (포항공과대학교 전자전기공학과) ;
  • 김수은 (포항공과대학교 전자전기공학과) ;
  • 박홍준 (포항공과대학교 전자전기공학과)
  • Published : 2002.06.01
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Abstract

Several charge Injection compensation circuits, such as, the dummy transistor circuit, the switched OP-amp circuit, the switched capacitor circuit, were fabricated and the test results were compared. The differences between SPICE simulation results and measurements were within around 10%.

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