Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2002.06a
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- Pages.211-214
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- 2002
A study on a Measurement Method of the Circular-to-Rectangular Waveguide Transition characteristics.
원형-구형 도파관 변환부의 특성 측정 방법 연구
Abstract
In this paper, we present a simple method for characterizing a rectangular waveguide to circular waveguide transition Three standard loads consisting of a short circuit, an offset short circuit 1, and an offset short circuit 2 are sequentially connected to the circular waveguide port and the reflection coefficient at port 1 Is measured for each case. From known reflection coefficients, of standard loads and measured reflection coefficients, the scattering matrix of the transition Is obtained. The proposed method Is verified by the numerical experiment using a commercial software HFSS and by measurments of a actual rectangular-to-circular waveguide transition.
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