Z-contrast scanning transmission electron microscopy and its applications on grain boundary structure/property studies
- Kim, Mi-Young (Analytical Engineering Center, Samsung Advanced Institute of Technology, Solid State Division, Oak Ridge National Laboratory) ;
- Duscher, Gerd (Solid State Division, Oak Ridge National Laboratory, Dept. Materials Science and Engineering, North Carolina State University) ;
- Browning, Nigel D. (Dept. Physics, University of Illinois at Chicago) ;
- Pantelides, Sokrates T. (Solid State Division, Oak Ridge National Laboratory, Dept. Physics and Astronomy, Vanderbilt University) ;
- Pennycook, Stephen J. (Solid State Division, Oak Ridge National Laboratory, Dept. Physics and Astronomy, Vanderbilt University)
- Published : 2001.05.01
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