Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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measurement system development of MOCX performance evaluation

Micro optical cross connect의 성능평가를 위한 시스템의 개발

  • Kim, A-Ron (Electrical and Electronic Engineering College of Engineering Chung-Ang University) ;
  • Kim, Ho-Seong (Electrical and Electronic Engineering College of Engineering Chung-Ang University)
  • 김아론 (중앙대학교 전자전기 공학부) ;
  • 김호성 (중앙대학교 전자전기 공학부)
  • Published : 2001.11.24
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Abstract

This paper reports on the development of Micro optical cross connector(MOXC) performance evaluation system using DAQ board and Labview. The system is composed of optical part, driving circuit and software part, this evaluation system can measure insertion loss, response time and life time of MOXC, this system canbe used in mass production of MOXC.

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