대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

60W 출력을 가지는 반도체 소자의 직류 특성 측정시스템의 구현

Implementation of the 60W DC Characteristic Measurement System for Semiconductor Devices

  • 최인규 (경북대학교 전자공학과) ;
  • 최창 (경북대학교 전자공학과) ;
  • 한해진 (울산기능대학 정보통신설비과) ;
  • 박종식 (경북대학교 전자공학과)
  • Choi, In-Kyu (Dept of Electronic Engineering, Kyungpook National University) ;
  • Choi, Chang (Dept of Electronic Engineering, Kyungpook National University) ;
  • Han, Hye-Jin (Dept. of information and Data Communication, Ulsan Polytechnic College) ;
  • Park, Jong-Sik (Dept of Electronic Engineering, Kyungpook National University)
  • 발행 : 2001.11.24
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

In this paper, we designed and implemented the 60W DC characteristic measurement system for semiconductor devices. The proposed system is composed of 2 SMU(Source and Measure Unit)s, 2 HPU(High power Unit)s, 2VSU(Voltage Source Unit)s, and 2 VMU(Voltage Measurement Unit)s. HPU can source/measure voltage from -200V to 200V and source/measure current from -3A to 3A within 60W. Experimental results show that the implemented system can measure the power devices such as power BJT, regulator IC, and voltage detector.

키워드