Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2001.11c
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- Pages.34-37
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- 2001
Implementation of the 60W DC Characteristic Measurement System for Semiconductor Devices
60W 출력을 가지는 반도체 소자의 직류 특성 측정시스템의 구현
- Choi, In-Kyu (Dept of Electronic Engineering, Kyungpook National University) ;
- Choi, Chang (Dept of Electronic Engineering, Kyungpook National University) ;
- Han, Hye-Jin (Dept. of information and Data Communication, Ulsan Polytechnic College) ;
- Park, Jong-Sik (Dept of Electronic Engineering, Kyungpook National University)
- Published : 2001.11.24
Abstract
In this paper, we designed and implemented the 60W DC characteristic measurement system for semiconductor devices. The proposed system is composed of 2 SMU(Source and Measure Unit)s, 2 HPU(High power Unit)s, 2VSU(Voltage Source Unit)s, and 2 VMU(Voltage Measurement Unit)s. HPU can source/measure voltage from -200V to 200V and source/measure current from -3A to 3A within 60W. Experimental results show that the implemented system can measure the power devices such as power BJT, regulator IC, and voltage detector.
Keywords