대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2001년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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- Pages.219-223
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- 2001
초고속 LINESCAN 방식의 자동 결함 검출 시스템 기술개발에 관한 연구
The Study on the technological development of the Automatic defect testing system by using the very high speed linescan method
- Lee, Kyu-Hun (Dongguk University) ;
- Kim, Yong (Dongguk University) ;
- Kim, Hee-Tae (Ajuhitek) ;
- Eom, Ki-Bok (Dongguk University) ;
- Won, Hye-Kyung (Dongguk University)
- 발행 : 2001.10.26
초록
This paper proposed the Automatic defect testing technology which used in the defect test of printed things and external shapes in the precision industry. According to adapting the very high speed image processor called ASIC for high resolution. This system also realized that the System being able to perform the very high speed resolution testing. As the image processing algorithm, Run-length coding, Multi-level threshold and fast-adaptive line matching were applied.
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