The Study on the technological development of the Automatic defect testing system by using the very high speed linescan method

초고속 LINESCAN 방식의 자동 결함 검출 시스템 기술개발에 관한 연구

This paper proposed the Automatic defect testing technology which used in the defect test of printed things and external shapes in the precision industry. According to adapting the very high speed image processor called ASIC for high resolution. This system also realized that the System being able to perform the very high speed resolution testing. As the image processing algorithm, Run-length coding, Multi-level threshold and fast-adaptive line matching were applied.