Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2001.06d
- /
- Pages.9-12
- /
- 2001
Selective Ridge Matching for Poor Quality Fingerprint verification
열악한 지문 영상의 검증을 위한 선택적 융선 정합 기법
Abstract
Point pattern matching schemes for finger print recognition do not guarantee robust matching performance for finger print images of poor quality. We present a finger print recognition scheme, where transformation parameter of matched ridge pairs are estimated by Hough transform and the matching hypothesis is verified by a new measure of the matching degree using selective directional information. Proposed method may exhibit extremely low FAR(False Accept Ratio) while maintaining low reject ratio even for the images of poor quality because of the robustness to the variation of minutia points.
Keywords