Size and Relative Co Layer Thickness Dependence of Magnetization-Flop in Magnetic Tunnel Junctions Exchange-Biased by Co/Ru/Co Synthetic Antiferromagnets

  • Uhm, Y.R. (Korea Institute of Science and Technology (KIST)) ;
  • Lim, S.H. (Korea Institute of Science and Technology (KIST))
  • 발행 : 2001.10.01