직교배열법에 의한 칩절단특성 예측

Pridiction of chip breakability by an orthogonal array method

The purpose of this paper is to evaluate the chip breakability during turning using the experimental equation, which is developed by an orthogonal array method. The chip breaking index(CB), non-dimensional parameter is used in the evaluation of chip breakability. The analysis of variance(ANOVA)-test has been used to check the significance of cutting parameters. And using the result of ANOVA-test, the experimental equation of chip breakability, which consists of significant cutting parameters, has been developed.