Speckle Interferometric Detection of Defects on the backside of steel plate

스페클 간섭계를 이용한 평판 이면결함의 검출 특성

Backside defect of plate structure may grow due to fatigue or overload to cause critical failure during operation, so it is important to detect this kind of defect in line. For this purpose, nondestructive, non-contact and highly sensitive method is required. ESPI and Shearography are considered as useful method to satisfy these requirements. In this paper, the possibility of application of ESPI and Shearography to detect the backside defect of steel plate and to quantify the defect size was tested. For the experiment, some steel plates with defect on the backside were prepared. Experimental results for these plates showed that location and size of defect could be detected correctly by both of ESPI and Shearography.