한국소성가공학회:학술대회논문집 (Proceedings of the Korean Society for Technology of Plasticity Conference)
- 한국소성가공학회 2001년도 춘계학술대회 논문집
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- Pages.250-253
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- 2001
반도체 패키징용 Gold Bonding Wire의 변형특성 및 해석
Deformation Properties of Gold Bonding Wire for VLSI Packaging Applications
- Kim K. (Korea Advanced Institute of Science and Technology, Dept. of Materials Science and Engineering) ;
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Hong S. H.
(Korea Advanced Institute of Science and Technology, Dept. of Materials Science and Engineering)
- 발행 : 2001.05.01
초록
Mechanical properties of gold bonding wire for VLSI packaging have been studied. The diameters of gold wires are about 20-30 micrometer and fracture loads are 8-20 gram force. The elastic modulus, yield strength, fracture strength and elongation properties have been evaluated by micro-tensile test method. This work discusses for an appropriate selection of micro-force testing system and grip design in mim testing. The best method to determine gauge length of wire and to measure tensile properties has been proposed. The mechanical properties such as strength and elastic modulus of current gold bonding wire are higher than pure those of gold wire.