Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2001.07c
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- Pages.1576-1578
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- 2001
A Study on the Improvement of Lifetime with Short-Term Test Method of AC PDP
AC PDP의 장수명 인자의 단시간 시험 방법에 의한 수명 증대 기술에 관한 연구
- Kim, Yun-Gi (Dept. Electrical Engineering Pusan National University) ;
- Choi, Min-Seok (Dept. Electrical Engineering Pusan National University) ;
- Lyu, Seong-Nam (Dept. Electrical Engineering Pusan National University) ;
- Park, Cha-Soo (Dept. Electrical Engineering Pusan National University) ;
- Lee, Ho-Jun (Dept. Electrical Engineering Pusan National University) ;
- Park, Chung-Hoo (Dept. Electrical Engineering Pusan National University)
- 김윤기 (부산대학교 전기공학과) ;
- 최민석 (부산대학교 전기공학과) ;
- 류성남 (부산대학교 전기공학과) ;
- 박차수 (부산대학교 전기공학과) ;
- 이호준 (부산대학교 전기공학과) ;
- 박정후 (부산대학교 전기공학과)
- Published : 2001.07.18
Abstract
In this paper, a short-term test method to diagnose and estimate the lifetime of AC PDP(Plasma Display Panel) has been proposed. As using this method, we investigated the lifetime of MgO layer in AC PDP. The lifetime was increased in proportion to an MgO thickness but it was allowed when the MgO thickness was raised until 5000
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