Nanometer-Scale Surface Analysis of Polymers Using Laser Ablation Spectroscopy

레이저 애벌레이션 분광을 이용한 고분자 표면의 나노미터 스케일 표면 분석

In this study, laser ablation atomic fluorescence (LAAF) spectroscopy has been applied for a nanometer-scale surface analysis of Na-doped polymethyl methacrylate (PMMA). LAAF spectroscopy is a new sensitive element detection technique which involves atomizing of a sample by the laser ablation and detection of ablated plume by laser-induced fluorescence (LIF) spectroscopy. Using this technique in the detection of Na atoms with Na-doped PMMA, a detection limit is obtained as 36 fg for single laser shot. Further, the depth distribution in the sample is measured with a very high spatial resolution using a two-layer PMMA sample by observing the shot-by-shot LIF intensity from the Na atoms.