한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2000년도 영호남학술대회 논문집
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- Pages.327-330
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- 2000
SPM을 이용한 박막의 모폴로지, 표면전위와 광투과이미지 관찰
Observation of Morphology, Surface potential and Optical Transmission Images in the Thin Film Using SPM
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Shin, Hoon-Kyu
(Dept. of Electrical Eng., Dong-A University) ;
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Kwon, Young-Soo
(Dept. of Electrical Eng., Dong-A University)
- 발행 : 2000.05.13
초록
The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. The Scanning near-field optical / atomic force microscopy (SNOAM) is a new tool for surface imaging which was introduced as one application of the atomic force microscope (AFM). Operated with non-contact forces between the optical fiber and sample as well as equipped with the piezoscanners, the instrument reports on surface topology without damaging or modifying the surface for measuring of optical characteristic in the films. We report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films by SMM. Furthermore, we have illustrated the SNOAM image in obtaining the merocyanine dye films as well as the optical image.
키워드