한국정보디스플레이학회:학술대회논문집
- 2000.01a
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- Pages.199-200
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- 2000
Application of Rotating Polarizer Method to Low LC Cell Gap Measurement
- Kim, Chang-Son (Dept. of Electronics Engineering, Pusan National University) ;
- Lee, Gi-Dong (Dept. of Electronics Engineering, Pusan National University) ;
- Yoon, Tae-Hoon (Dept. of Electronics Engineering, Pusan National University) ;
- Kim, Jae-Chang (Dept. of Electronics Engineering, Pusan National University)
- Published : 2000.01.13
Abstract
Measurement of low cell gap and retardation by using a rotating polarizer method was proposed. For more precise calculation and measurement, we applied a retardation film that has large retardation value of
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