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Korean Society of Microscopy
http://microscopy.or.kr/
한국전자현미경학회:학술대회논문집
2000.11a
/
Pages.37-38
/
2000
Korean Society of Microscopy (한국현미경학회)
Electron Probe를 이용한 미량원소 정량분석법
Lee Seok-Hun
;
Im So-Hyeon
이석훈
(기초과학지원연구소 중앙분석기기부) ;
임소현
(기초과학지원연구소 중앙분석기기부)
Published : 2000.11.01
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