내부고장요인과 외부고장요인이 있는 제품에 대한 가속수명 시험의 분석

Analysis of Accelerated Life Tests with Intrinsic and Extrinsic Failure Modes

  • Kim, C. M. (Korea Advanced Institute of Science and Technology, Department of Industrial Engineering) ;
  • D. S, Bai (Korea Advanced Institute of Science and Technology, Department of Industrial Engineering)
  • 발행 : 2000.04.01

초록

This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated lift tests when extrinsic failure mode as well as intrinsic one exists. A mixture of two log-normal distributions is introduced to describe these failure modes and it is assumed that a linear relation exists between the location parameter and stress. An estimation procedure using the expectation and maximization algorithm is proposed and a numerical example is given.

키워드